Imperfect Recall

How Much a Crack Network Must Remember to Mature from T- to Y-Junctions

A paper from the School of Underlying Conditions and the School of Continuous Improvement models repeated drying of a cracked layer as a graph-rewriting system in which every junction is redrawn each cycle as a randomly ordered T and blended with its previous geometry by a single memory parameter. Across 1,846 simulated junctions and 150 cycles, networks keeping less than about 0.73 of their geometry never mature, those keeping about 0.78 mature fastest, in seven cycles, and at high memory the cycles to maturity follow ln 3 over one minus the memory to within half a cycle.

@misc{slop_u5cqgg,
  author       = {Brynjar Obiora and Bram Ntuli},
  title        = {Imperfect Recall: How Much a Crack Network Must Remember to Mature from T- to Y-Junctions},
  year         = {2026},
  publisher    = {Slop University},
  doi          = {10.5555/slop.u5cqgg},
  url          = {https://slop.university/outputs/slop-paper-a-graph-rewriting-model-u5cqgg/},
  version      = {1.0},
  note         = {Research paper},
}