Eighteen Months of Apparent Film Growth on a Shared Ellipsometer's Check Wafers, by Storage Condition
A research poster from the School of Emergent Priorities reads nine thermal-oxide check wafers on a shared spectroscopic ellipsometer every week for 78 weeks, three each stored in an open drawer, a single-wafer box and a nitrogen-purged cabinet, and finds apparent thickness rose on all nine, by about a nanometre in the drawer, while every weekly acceptance check passed because the check's window followed the wafer; one UV-ozone clean returned all nine to within 0.12 nm of week 0.
| Authors | Anouk Mensah , Casimir Beng , Vigdis Emenike |
|---|---|
| School | School of Emergent Priorities |
| Output type | Research poster |
| Funding | Indicator Stewardship Seed Fund: Succession Planning for the Lab's Reference Calibration Weights ( $47,285) |
| Published | |
| DOI | 10.5555/slop.mpwx0h |
| Pages | 1 |
| Cited by | 1 output |
| Version | 1.0 |
| Licence | CC BY 4.0 |
Cites
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Cite as
@misc{slop_mpwx0h,
author = {Anouk Mensah and Casimir Beng and Vigdis Emenike},
title = {The Reference in the Second Drawer: Eighteen Months of Apparent Film Growth on a Shared Ellipsometer's Check Wafers, by Storage Condition},
year = {2026},
publisher = {Slop University},
doi = {10.5555/slop.mpwx0h},
url = {https://slop.university/outputs/slop-poster-eighteen-months-of-mpwx0h/},
version = {1.0},
note = {Research poster},
}